Proceedings of the IDETC/CIE conference feature cutting edgeresearch and accomplishments related to design concepts ofmachining, reliability, and manufacturability, and the applicationof computer simulation to the engineering process.
Printed collection on 112 full-length, peer-reviewed technicalpapers. Topics include:
5th International Conference on Micro- and Nanosystems (MNS)
8th International Conference on Design and Design Education(DEC)
21st Reliability, Stress Analysis, and Failure PreventionConference (RSAFP)
ISBN No:978-0-7918-5484-6
Total Number of Pages: 988