(812) 309-78-59
(495) 223-46-76
ASTM E1152-95
Test Method for Determining J-R Curves (Withdrawn 1997)
11 стр.
Заменен
Печатное изданиеЭлектронный (pdf)
107.64 $ (включая НДС 20%)
Разработчик:
Зарубежные/ASTM
ICS:
77.040.10 Mechanical testing of metals / Механические испытания металлов
Сборник (ASTM):
03.01 Metals -- Mechanical Testing; Elevated and Low-Temperature Tests; Metallography / Металлы - Механические испытания, Испытания при высоких и низких температурах, Металлография
Тематика:
Fatigue & Fracture
Описание
Область применения

1.1 This test method covers the determination of the J-integral versus crack growth resistance curves (J-R curve) for metallic materials.

1.2 The recommended specimens are the pin-loaded compact (C(T)) and the three-point bend ( SE (B)) specimens. Both have in-plane dimensions of constant proportionality for all sizes. Specimen configurations other than those recommended in this test method may require different procedures and validity requirements.

1.3 This test method is intended to characterize the slow, stable crack growth resistance of bend-type specimens in such a manner that it is geometry insensitive within limits set forth in this test method.

1.4 The single specimen elastic compliance test method is detailed herein, but other techniques of measuring crack length are permissible if they equal or exceed the accuracy requirements of this test method.

1.5 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only.

1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Ключевые слова:
Bend testing-metallic materials; Crack extension; Cracking-crack growth; Cracking-metallic materials; Cracking resistance; Crack length; Dispersion; Displacement; J integral (Jic); J-R curves; Loading tests-metals/alloys; Metals and metallic materials; Pin-loaded compact specimens; Resistance; SE(B) specimen testing; Silicon semiconductors; Specimen preparation (for testing)-corrosion testing; Third-point loading; J-R curves, test