(812) 309-78-59
(495) 223-46-76
ASTM E1172-87(2011)
Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer
5 стр.
Заменен
Электронный (pdf)Печатное издание
96.72 $ (включая НДС 20%)
Разработчик:
Зарубежные/ASTM
ICS:
17.180.30 Optical. Including spectroscopes, geodetic instruments, etc. / Оптические измерительные приборы. Включая спектроскопы, геодезические инструменты и т.д.
Сборник (ASTM):
03.05 Analytical Chemistry for Metals, Ores, and Related Materials / Аналитическая химия для металлов, руд и сопутствующих материалов: с E32 и далее
Тематика:
Analytical Chemistry
Описание
Значение и использование

This practice describes the essential components of a wavelength-dispersive X-ray spectrometer. This description is presented so that the user or potential user may gain a cursory understanding of the structure of an X-ray spectrometer system. It also provides a means for comparing and evaluating different systems as well as understanding the capabilities and limitations of each instrument.

Область применения

1.1 This practice covers the components of a wavelength-dispersive X-ray spectrometer that are basic to its operation and to the quality of its performance. It is not the intent of this practice to specify component tolerances or performance criteria, as these are unique for each instrument. The document does, however, attempt to identify which of these are critical and thus which should be specified.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific safety hazard statements are given in 5.3.1.2 and 5.3.2.4, and in Section 7.

1.3 There are several books and publications from the National Institute of Standards and Technology and the U.S. Government Printing Office , which deal with the subject of X-ray safety. Refer also to Practice E416.

Ключевые слова:
spectroscopy; X-ray emission; X-ray spectrometer