(812) 309-78-59
(495) 223-46-76
ASTM E1855-05e1
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
10 стр.
Заменен
Печатное изданиеЭлектронный (pdf)
96.72 $ (включая НДС 20%)
Разработчик:
Зарубежные/ASTM
ICS:
31.200 Integrated. Including electronic chips, logical and analogue microstructures / Интегральные схемы. Микроэлектроника. Включая электронные микросхемы, логические и аналоговые микроструктуры
Сборник (ASTM):
12.02 Nuclear (II), Solar, and Geothermal Energy; Radiation Processing / Ядерная энергия (II), Солнечная, и Геотермическая Энергия; Радиационная обработка
Тематика:
Nuclear Technology
Описание
Область применения

1.1 This test method covers the use of 2N2222A silicon bipolar transistors as dosimetry sensors in the determination of neutron energy spectra, and as silicon 1-MeV equivalent displacement damage fluence monitors.

1.2 The neutron displacement damage is especially valuable as a spectrum sensor in the range 0.1 to 2.0 MeV when fission foils are not available. It has been applied in the fluence range between 2 X 1012 n/cm2 and 1 X 1014 n/cm2 and should be useful up to 1015 n/cm2. This test method details the steps for the acquisition and use of silicon 1-MeV equivalent fluence information (in a manner similar to the use of activation foil data) for the determination of neutron spectra.

1.3 In addition, this sensor can provide important confirmation of neutron spectra determined with other sensors, and yields a direct measurement of the silicon 1-MeV fluence by the transfer technique.

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory requirements prior to use.

Ключевые слова:
displacement damage; neutron damage; radiation hardness; silicon transistors; spectrum sensors