5.1 This procedure is suitable for manufacturing control and for verifying that the product meets specifications. It provides rapid, multi-element determinations with sufficient accuracy to assure product quality. The analytical performance data included may be used as a benchmark to determine if similar X-ray spectrometers provide equivalent precision and accuracy, or if the performance of a particular spectrometer has changed.
1.1 This test method covers the analysis of Ni-base alloys by wavelength dispersive X-ray Fluorescence Spectrometry for the determination of the following elements:
Element | Composition Range |
Manganese | 0.06 % to 1.6 % |
Phosphorus | 0.008 % to 0.015 % |
Silicon | 0.08 % to 0.6 % |
Chromium | 1.6 % to 22 % |
Nickel | 23 % to 77 % |
Aluminum | 0.20 % to 1.3 % |
Molybdenum | 0.03 % to 10 % |
Copper | 0.007 % to 2.5 % |
Titanium | 0.11 % to 3.0 % |
Niobium | 0.55 % to 5.3 % |
Iron | 0.17 % to 46 % |
Tungsten | 0.06 % to 0.50 % |
Cobalt | 0.04 % to 0.35 % |