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ASTM E673-03
Standard Terminology Relating to Surface Analysis (Withdrawn 2012)
10 стр.
Отменен
Печатное изданиеЭлектронный (pdf)
96.72 $ (включая НДС 20%)
Разработчик:
Зарубежные/ASTM
ICS:
17.040.20 Properties of surfaces / Свойства поверхностей01.040.17 Metrology and measurement. Physical phenomena (Vocabularies) / Метрология и измерения. Физические явления (Словари)
Сборник (ASTM):
03.06 Molecular Spectroscopy and Separation Science; Surface Analysis / Молекулярная спектроскопия; Анализ поверхности
Тематика:
Spectroscopy
Описание
Причина отмены

This terminology is related to the various disciplines involved in surface analysis.

Formerly under the jurisdiction of Committee E42 on Surface Analysis, this terminology was withdrawn in January 2012 in accordance with section 10.5.3.1 of the Regulations Governing ASTM Technical Committees, which requires that standards shall be updated by the end of the eighth year since the last approval date.

Область применения

1.1 This terminology is related to the various disciplines involved in surface analysis.

1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).

Ключевые слова:
terminology; surface analysis