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ASTM E996-10(2018)
Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
3 стр.
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Разработчик:
Зарубежные/ASTM
ICS:
19.100 Non-destructive. Including testing equipment: industrial apparatus for X-ray and gamma radiography, penetrant flaw detectors, etc. / Неразрушающие испытания. Включая испытательное оборудование: промышленная аппаратура для рентгеновской и гамма-радиографии, проникающие дефектоскопы и т.д.
Сборник (ASTM):
03.06 Molecular Spectroscopy and Separation Science; Surface Analysis / Молекулярная спектроскопия; Анализ поверхности
Тематика:
Spectroscopy
Описание
Значение и использование

5.1 Include the experimental conditions under which spectra are taken in the “Experiment” section of all reports and publications.

5.2 Identify any parameters that are changed between different spectra in the “Experiment” section of publications and reports, and include the specific parameters applicable to each spectrum in the figure caption.

Область применения

1.1 Auger and X-ray photoelectron spectra are obtained using a variety of excitation methods, analyzers, signal processing, and digitizing techniques.

1.2 This practice lists the desirable information that shall be reported to fully describe the experimental conditions, specimen conditions, data recording procedures, and data transformation processes.

1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Ключевые слова:
Auger electron spectroscopy; surface analysis; X-ray photoelectron spectroscopy;