This method is for determining trace (mass-ppm) concentrationsof aluminum, silicon and silver in acetic acid by InductivelyCoupled Plasma-Optical Emission Spectrometry (ICP-OES). The lowerlimits of detection for aluminum, silicon, and silver are 0.1mass-ppm, 1 mass-ppm, and 0.01 mass-ppm, respectively. The upperrange of determination is approximately 100 mass-ppm. The method isalso applicable, but has not been verified, for the determinationof other metals.