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BS IEC 60747-5-62. Semiconductor devices. Part 5-9. Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
22 стр.
Действует
Печатная копияПечатное издание
30.24 £ (включая НДС 20%)
Разработчик:
Зарубежные/BSI
ICS:
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
Ключевые слова:
Ratings, Semiconductors, Semiconductor devices, Integrated circuits, Electronic equipment and components, Electrical measurement, Electrical properties and phenomena, Temperature-measuring instruments, Temperature measurement, Probes