Ключевые слова:
Temperature|Transistors|Semiconductor devices|Approval testing|Electric current|Noise (spurious signals)|Ratings|Testing conditions|Assessed quality|Capacitance|Rated voltage|Rated power|Qualification approval|Statistical quality control|Electronic equipment and components|Electrical properties and phenomena|Inspection|Working range|Quality control|Frequencies|Amplifiers|Voltage|Quality assurance systems|Bipolar transistors|Rated current