Ключевые слова:
Testing conditions|Electrical impedance|Semiconductor devices|Electronic equipment and components|Torque|Electrical properties and phenomena|Breakdown voltage|Rated power|Voltage-reference diodes|Semiconductor diodes|Approval testing|Diodes|Inspection|Assessed quality|Statistical quality control|Voltage|Qualification approval|Quality assurance systems|Temperature|Ratings|Leakage currents|Working range|Electric terminals|Studs (fasteners)|Quality control