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BS CECC 20000:1983
Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices
100 стр.
Действует
Печатное изданиеПечатная копия
414.29 £ (включая НДС 20%)
Разработчик:
Зарубежные/BSI
ICS:
31.260 Optoelectronics. Including photoelectric tubes and cells / Оптоэлектроника. Лазерное оборудование, 31.120 Electronic. Including liquid crystal displays / Электронные дисплеи. Включая дисплеи на жидких кристаллах
Ключевые слова:
Marking|Capacitance measurement|Optoelectronic devices|Couplers|Overvoltage tests|Wavelengths|Endurance testing|Optical measurement|Luminous intensity|Semiconductor devices|Radiometry|Light-emitting diodes|Light-emitting devices|Light distribution|Inspection|Surges (electrical)|Electrical testing|Qualification approval|Testing conditions|Phototransistors|Quality assurance systems|Voltage measurement|Sampling methods|Electrical measurement|Solderability testing|Approval testing|Liquid crystal devices|Short-circuit current tests|Designations|Resistance measurement|Luminance|Radiant flux density|Circuits|Infrared radiation|Flashover|Assessed quality|Electronic equipment and components|Specification (approval)|Bandwidths|Test equipment|Time measurement|Mechanical testing|Environmental testing|Thermal-cycling tests|Photodiodes|Performance testing|Current measurement|Orientation|Leak tests