Ключевые слова:
Temperature coefficient of resistance|Quality assurance systems|Resistors|Detail specification|Thick-film circuits|Qualification approval|Testing conditions|Specification (approval)|Assessed quality|Statistical quality control|Quality control|Thick-film devices|Sampling methods|Electrical tolerances|Circuits|Approval testing|Ratings|Thin-film devices|Inspection|Integrated circuits|Fixed resistors|Electronic equipment and components|Thin-film circuits|Performance