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BS CECC 90112:1987
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits
38 стр.
Действует
Печатная копияПечатное издание
299.38 £ (включая НДС 20%)
Разработчик:
Зарубежные/BSI
ICS:
31.200 Integrated. Including electronic chips, logical and analogue microstructures / Интегральные схемы. Микроэлектроника. Включая электронные микросхемы, логические и аналоговые микроструктуры
Ключевые слова:
Electronic equipment and components, Specification (approval), Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Detail specification, Quality control, Statistical quality control, Monolithic integrated circuits, Digital integrated circuits, Integrated circuits, Semiconductor storage, Direct-access storage, Semiconductor devices, Metal oxide semiconductors, Silicon, Computer storage devices, Digital circuits, Electronic storage, Circuits, Testing conditions, Inspection, Integrated memory circuits