Ключевые слова:
Inspection|Performance testing|Voltage measurement|Semiconductor devices|Light-emitting diodes|Electronic equipment and components|Mechanical testing|Optical measurement|Quality assurance systems|Verification|Marking|Light-emitting devices|Phototransistors|Defects|Quality control|Approval testing|Designations|Couplers|Circuits|Capability approval|Light distribution|Test equipment|Electrical measurement|Visual inspection (testing)|Specification (approval)|Handbooks|Sampling methods|Resistance measurement|Current measurement|Assessed quality|Liquid crystal devices|Environmental testing|Statistical quality control|Optoelectronic devices|Qualification approval|Electrical testing|Testing conditions|Endurance testing|Photodiodes|Detail specification