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BS EN 60749-13:2002
Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere
10 стр.
Заменен
Печатная копияПечатное издание
154.22 £ (включая НДС 20%)
Разработчик:
Зарубежные/BSI
ICS:
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
Ключевые слова:
Corrosion resistance, Electronic equipment and components, Accelerated corrosion tests, Integrated circuits, Destructive testing, Environmental testing, Mechanical testing, Salts, Salt-spray tests, Accelerated testing, Climate, Semiconductor devices