(812) 309-78-59
(495) 223-46-76
BS EN 60749-26:2006
Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
18 стр.
Заменен
Печатная копияПечатное издание
157.25 £ (включая НДС 20%)
Разработчик:
Зарубежные/BSI
ICS:
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
Ключевые слова:
Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Electrostatics, Sensitivity, Classification systems, Grades (quality), Electrical testing, Damage, Degradation, Human body, Test models