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BS EN 60749-5:2003
Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test
12 стр.
Заменен
Печатная копияПечатное издание
148.18 £ (включая НДС 20%)
Разработчик:
Зарубежные/BSI
ICS:
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
Ключевые слова:
Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Damp-heat tests, Watertightness tests, Thermal testing, Endurance testing, Humidity, Destructive testing