Ключевые слова:
Semiconductor devices, Integrated circuits, Electrical components, Electronic equipment and components, Electrical equipment, Digital integrated circuits, Letters (symbols), Symbols, Ratings, Electrical properties and phenomena, Integrated memory circuits, Electrical measurement, Endurance testing, Electrical testing, Read-only storage, Microprocessor chips, Definitions, Test equipment, Circuits, Combinational circuits, Sequential circuits, Integrated logic circuits, Performance testing, Acceptance (approval), Reliability