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BS ISO 16531:2013
Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
28 стр.
Действует
Печатная копияПечатное издание
257.04 £ (включая НДС 20%)
Разработчик:
Зарубежные/BSI
ICS:
71.040.40 Chemical. Including analysis of gases and surface chemical analysis / Химический анализ. Включая анализ газов
Ключевые слова:
Surfaces, Surface chemistry, Optical measurement, Chemical composition, Glow discharges, Quantitative analysis, Spectroscopy, Chemical analysis and testing, Thickness, Mass