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BS ISO 20341:2003
Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials
14 стр.
Действует
Печатная копияПечатное издание
154.22 £ (включая НДС 20%)
Разработчик:
Зарубежные/BSI
ICS:
71.040.40 Chemical. Including analysis of gases and surface chemical analysis / Химический анализ. Включая анализ газов
Ключевые слова:
Mass spectrometry, Statistical methods of analysis, Spectroscopy, Normal distribution, Surface chemistry, Chemical analysis and testing, Damping coefficient, Depth measurement, Surface properties, Test methods, Mathematical calculations, Secondary, Ions, Depth