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PD IEC/TS 62878-2-4:2015
Device embedded substrate. Guidelines. Test element groups (TEG)
38 стр.
Действует
Печатная копияПечатное издание
299.38 £ (включая НДС 20%)
Разработчик:
Зарубежные/BSI
ICS:
31.190 Electronic. Including preassembled modules / Электронные компоненты в сборе. Включая предварительно собранные модули, 31.180 Printed circuits and boards / Печатные схемы и платы
Ключевые слова:
Electrical testing, Vibration testing, Industrial, Technical documents, Interfaces (data processing), Impact testing, Process control, Maintenance, Accelerated testing, Electric power system disturbances, Mechanical testing, Drop tests, Safety measures, Transducers, Dynamic testing, Classification systems, Flow measurement, Installation, Accuracy, Transmitters, Control systems, Environmental testing, Thermal testing, Grades (quality), Testing conditions, Performance testing, Test equipment, Stability, Automatic control systems, Damp-heat tests