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IEC 60147-2C:1970 ed1.0
Supplement C - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
73 стр.
Отменен
Печатная копияЭлектронный (pdf)
327.60 CHF (включая НДС 20%)
Разработчик:
Зарубежные/IEC
ICS:
31.080.10 Diodes / Диоды
Описание
Deals with transistors and considers collector-base capacitance of transistors, gives voltage ratings and measurable characteristics limiting the working voltages, indicates methods of measuring thermal resistance and defines switching and high-frequency parameters.