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IEC 60748-20-1:1994 ed1.0
Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination
55 стр.
Действует
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Разработчик:
Зарубежные/IEC
ICS:
31.200 Integrated. Including electronic chips, logical and analogue microstructures / Интегральные схемы. Микроэлектроника. Включая электронные микросхемы, логические и аналоговые микроструктуры
Описание
The purpose of these examinations is to check the internalmaterials, construction and workmanship of film and hybridintegrated circuits (F and HFICs). These examinations will normally be used prior to tapping orencapsulation to detect and eliminate the F and HFICs with internaldefects that could lead to device failure in normal application.Other acceptance criteria may be agreed upon with the purchaser orsupplier, respectively.