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IEC 60749-8:2002 ed1.0
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
31 стр.
Действует
Электронный (pdf)Печатная копия
114.66 CHF (включая НДС 20%)
Разработчик:
Зарубежные/IEC
ICS:
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
Описание
Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.The contents of the corrigenda of April 2003 and August 2003 have been included in this copy.