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IEC 60749:1996 ed2.0
Semiconductor devices - Mechanical and climatic test methods
95 стр.
Заменен
Печатная копияЭлектронный (pdf)
393.12 CHF (включая НДС 20%)
Разработчик:
Зарубежные/IEC
ICS:
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
Описание
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made.Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.