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IEC PAS 62163:2000 ed1.0
External visual test method
3 стр.
Заменен
Электронный (pdf)Печатная копия
16.38 CHF (включая НДС 20%)
Разработчик:
Зарубежные/IEC
ICS:
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
Описание
The purpose of this examination is to verify that the materials, design, construction, markings, and workmanship of the device are in accordance with the applicable procurement document. External Visual is a non-destructive test and applicable for all package types.