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IEC PAS 62189:2000 ed1.0
Bias Life
6 стр.
Заменен
Электронный (pdf)Печатная копия
32.76 CHF (включая НДС 20%)
Разработчик:
Зарубежные/IEC
ICS:
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
Описание
This test is performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time. It is intended primarily for device qualification and reliability monitoring.