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IEC TR 63133:2017 ed1.0
Semiconductor devices - Scan based ageing level estimation for semiconductor devices
17 стр.
Действует
Печатная копияЭлектронный (pdf)
163.80 CHF (включая НДС 20%)
Разработчик:
Зарубежные/IEC
ICS:
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
Описание
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.