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IEC TS 62228:2007 ed1.0
Integrated circuits - EMC evaluation of CAN transceivers
44 стр.
Заменен
Электронный (pdf)Печатная копия
442.26 CHF (включая НДС 20%)
Разработчик:
Зарубежные/IEC
ICS:
31.200 Integrated. Including electronic chips, logical and analogue microstructures / Интегральные схемы. Микроэлектроника. Включая электронные микросхемы, логические и аналоговые микроструктуры
Описание
Specifies test and measurement methods, test conditions, test setups, test procedures, failure criteria and test signals for the EMC evaluation of CAN transceivers concerning: - immunity against RF common mode disturbances on the signal lines - emissions caused by non-symmetrical signals regarding the time and frequency domain - immunity against transients (function and damage) - immunity against electrostatic discharges - ESD (damage)