The Symposium on Applications of Electron Microfractography toMaterials Research was given at the Seventy-third Annual Meeting ofthe American Society for Testing and Materials held in Toronto,Ont., Canada, 21—26 June 1970. The Sponsor of this symposium wasASTM Subcommittee II on Fractography and Associated Microstructuresof ASTM Committee E24 on Fracture Testing of Metals. W. Wiebe,National Research Council of Canada, presided as symposiumchairman.