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BS EN 190000:1996
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
206 стр.
Действует
Печатное изданиеПечатная копия
547.10 £ (включая НДС 20%)
Разработчик:
Зарубежные/BSI
ICS:
31.200 Integrated. Including electronic chips, logical and analogue microstructures / Интегральные схемы. Микроэлектроника. Включая электронные микросхемы, логические и аналоговые микроструктуры
Ключевые слова:
Dimensions|Accelerated testing|Capability approval|Circuits|Defects|Solderability testing|Symbols|Assessed quality|Surface defects|Endurance testing|Specification (approval)|Approval testing|Thermal testing|Electronic equipment and components|Quality control|Quality assurance systems|Marking|Test specimens|Vibration testing|Damp-heat tests|Environmental testing|Monolithic integrated circuits|Acceleration tests|Integrated circuits|Electrical testing|Formulae (mathematics)|Testing conditions|Definitions|Visual inspection (testing)|Impact testing|Inspection|Qualification approval|Detail specification|Orientation|Mechanical testing|Leak tests