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BS ISO 18118:2004
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
32 стр.
Заменен
Печатная копияПечатное издание
229.82 £ (включая НДС 20%)
Разработчик:
Зарубежные/BSI
ICS:
71.040.40 Chemical. Including analysis of gases and surface chemical analysis / Химический анализ. Включая анализ газов
Ключевые слова:
Surface chemistry, Chemical analysis and testing, Spectroscopy, Auger electron spectroscopy, Photoelectron spectroscopy, X-ray photoelectron spectroscopy, Electron emission, Quantitative analysis, Chemical composition, Sensitivity, Homogeneity, Experimental data