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IEC 60333:1993 ed3.0
Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures
76 стр.
Отменен
Электронный (pdf)Печатная копия
384.94 CHF (включая НДС 20%)
Разработчик:
Зарубежные/IEC
ICS:
17.240 Radiation. Including dosimetry / Измерения параметров излучений
Описание
Applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of semiconductor charged-particle detectors.