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BS EN 60749-16:2003
Semiconductor devices. Mechanical and climatic test methods. Particle impact noise detection (PIND)
10 стр.
Действует
Печатная копияПечатное издание
154.22 £ (включая НДС 20%)
Разработчик:
Зарубежные/BSI
ICS:
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
Ключевые слова:
Ceramics, Integrated circuits, Particulate materials, Vibration testing, Noise (spurious signals), Non-destructive testing, Wires, Semiconductor devices, Solders, Holes, Mechanical testing, Acoustic measurement, Environmental testing, Electronic equipment and components, Climate