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BS EN 60749-19:2003
Semiconductor devices. Mechanical and climatic test methods. Die shear strength
10 стр.
Действует
Печатная копияПечатное издание
105.84 £ (включая НДС 20%)
Разработчик:
Зарубежные/BSI
ICS:
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
Ключевые слова:
Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Electrical equipment, Electrical components, Shear strength, Shear testing, Strength of materials, Substrates (insulating), Quality control