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BS ISO 14606:2015
Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
28 стр.
Действует
Печатная копияПечатное издание
257.04 £ (включая НДС 20%)
Разработчик:
Зарубежные/BSI
ICS:
71.040.40 Chemical. Including analysis of gases and surface chemical analysis / Химический анализ. Включая анализ газов
Ключевые слова:
Surface chemistry, Surface properties, Chemical analysis and testing, Depth, Laminates, Profile measurement, Reference conditions, Control samples, Augers, Spectrochemical analysis, Spectroscopy, Electron emission, X-rays, Mass spectrometry, Radiation measurement, Microscopic analysis