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ASTM F327-78(2000)
Standard Practice for Sampling Gas Blow Down Systems and Components for Particulate Contamination by Automatic Particle Monitor Method
2 стр.
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Разработчик:
Зарубежные/ASTM
ICS:
71.040.40 Chemical. Including analysis of gases and surface chemical analysis / Химический анализ. Включая анализ газов
Сборник (ASTM):
15.03 Space Simulation; Aerospace and Aircraft; Composite Materials / Космическое моделирование; Аэрокосмическая и авиационная промышленности; Композиционные материалы
Тематика:
Aerospace Materials
Описание
Реферат

This practice describes the apparatus needed, and the procedures for connecting, preparing, and sampling pressurized gas blow down systems and components for particulate contamination by the use an automatic particle monitor. The sensing unit of the automatic particle monitor is connected to the designated sample port which is under purge condition. The system flow rate is then adjusted to the sample flow rate requirement. Finally, all the gas passing through the sensing unit is monitored for particulate contamination until the required sample volume has been analyzed.

Область применения

1.1 This practice describes how to connect, prepare, and sample pressurized gas systems (having up to 0.75-in. (19.1-mm) diameter lines) for particulate contamination by using an automatic monitor.

1.2 The values stated in inch-pound units are to be regarded as the standard. The values given in parentheses are for information only.

1.3 This standard does not purport to address all of the safety problems associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. For hazard statements, see Section 5.

Ключевые слова:
aerospace fluids/propellants-particulate contamination; blow down systems; contamination-particulate; gas distribution systems; particle size analysis-particle counters; particulate contamination; pressure testing-semiconductor applications; sampling-contamination; sampling-electronic materials/applications