(812) 309-78-59
(495) 223-46-76
BS EN 15991:2015
Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
30 стр.
Действует
Печатная копияПечатное издание
257.04 £ (включая НДС 20%)
Разработчик:
Зарубежные/BSI
ICS:
81.060.10 Raw materials / Сырье
Ключевые слова:
Ceramics, Raw materials, Refractory materials, Silicon inorganic compounds, Carbides, Particulate materials, Chemical analysis and testing, Determination of content, Impurities, Trace element analysis, Emission spectrophotometry, Vaporization