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BS EN 60749-14:2003
Semiconductor devices. Mechanical and climatic test methods. Robustness of terminations (lead integrity)
18 стр.
Действует
Печатная копияПечатное издание
184.46 £ (включая НДС 20%)
Разработчик:
Зарубежные/BSI
ICS:
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
Ключевые слова:
Integrated circuits, Semiconductors, Climate, Environmental testing, Bend testing, Defects, Interfaces, Tensile testing, Destructive testing, Fatigue testing, Mechanical testing, Electronic equipment and components, Qualification approval, Torque, Semiconductor devices, Testing conditions