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BS EN 60749-17:2003
Semiconductor devices. Mechanical and climatic test methods. Neutron irradiation
10 стр.
Действует
Печатная копияПечатное издание
154.22 £ (включая НДС 20%)
Разработчик:
Зарубежные/BSI
ICS:
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
Ключевые слова:
Semiconductor devices, Degradation, Space technology components, Nuclear particles, Mechanical testing, Environmental testing, Radiation measurement, Dosimeters, Military engineering, Integrated circuits, Military equipment, Neutrons, Climate, Destructive testing, Electronic equipment and components, Irradiation