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DIN 50451-3:2012-11
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Aluminium (Al), Arsenic (As), Barium (Ba), Beryllium (Be), Bismuth (Bi), Calcium (Ca), Cadmium (Cd), Cobalt (Co), Chromium (Cr), Copper (Cu), Iron (Fe), Gallium (Ga), Germanium (Ge), Hafnium (Hf), Indium (In), Potassium (K), Lithium (Li), Magnesium (Mg), Manganese (Mn), Molybdenum (Mo), Nickel (Ni), Niobium (Nb), Lead (Pb), Antimony (Sb), Tin (Sn), Strontium (Sr), Tantalum (Ta), Titanium (Ti), Vanadium (V), Zinc (Zn), Zirconium (Zr) in nitric acid by ICP-MS
Prüfung von Materialien für die Halbleitertechnologie - Bestimmung von Elementspuren in Flüssigkeiten - Teil 3: Aluminium (Al), Arsen (As), Barium (Ba), Beryllium (Be), Bismut (Bi), Calcium (Ca), Cadmium (Cd), Cobalt (Co), Chrom (Cr), Kupfer (Cu), Eisen (Fe), Gallium (Ga), Germanium (Ge), Hafnium (Hf), Indium (In), Kalium (K), Lithium (Li), Magnesium (Mg), Mangan (Mn), Molybdän (Mo), Nickel (Ni), Niob (Nb), Blei (Pb), Antimon (Sb), Zinn (Sn), Strontium (Sr), Tantal (Ta), Titan (Ti), Vanadium (V), Zink (Zn), Zirconium (Zr) in Salpetersäure mittels ICP-MS
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