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IEC 60147-2M:1980 ed1.0
Supplement M - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
37 стр.
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327.60 CHF (включая НДС 20%)
Разработчик:
Зарубежные/IEC
ICS:
31.080.10 Diodes / Диоды
Описание
Deals with measuring methods for signal and voltageregulator diodes, bipolar and field-effect transistors. Some methods, formerly described, are brought up to date according to more modern techniques or equipment; some others are newly described.