IEC 60749-11:2002/COR2:2003 ed1.0

Действует

Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method — 0 стр.

Modification of the validity date: now put at 2007.

ICS

31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом