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IEC 60749-12:2002 ed1.0
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
7 стр.
Заменен
Электронный (pdf)Печатная копия
16.38 CHF (включая НДС 20%)
Разработчик:
Зарубежные/IEC
ICS:
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
Описание
Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.