(812) 309-78-59
(495) 223-46-76
IEC 60749-31:2002 ed1.0
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
9 стр.
Действует
Печатная копияЭлектронный (pdf)
32.76 CHF (включая НДС 20%)
Разработчик:
Зарубежные/IEC
ICS:
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
Описание
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.The contents of the corrigendum of August 2003 have been included in this copy.