This part of IEC 61280 is to describe a test procedure to measure the eye pattern and waveform parameters such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask. This edition includes the following significant technical changes with respect to the previous edition:
- the necessity of DC coupling for extinction ratio measurement is clarified;
- the definition of extinction ratio has been revised to better harmonize with ITU-T; and
- the definition of OMA has been clarified.