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IEC 62276:2005 ed1.0
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
34 стр.
Заменен
Электронный (pdf)Печатная копия
384.94 CHF (включая НДС 20%)
Разработчик:
Зарубежные/IEC
ICS:
31.140 Piezoelectric devices / Пьезоэлектрические и диэлектрические приборы
Описание
Provides specifications for manufacturing piezoelectric single crystal wafers to be used in surface acoustic wave devices. Applies to the manufacture of synthetic quartz, lithium niobate, lithium tantalate, lithium tetraborate, and lanthanum gallium silicate single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave filters and resonators.