(812) 309-78-59
(495) 223-46-76
ASTM D4577-05(2010)
Standard Test Method for Compression Resistance of a Container Under Constant Load
7 стр.
Заменен
Электронный (pdf)Печатное издание
96.72 $ (включая НДС 20%)
Разработчик:
Зарубежные/ASTM
ICS:
55.040 Packaging. Including wrappers, paper, films, foils, cords, sealing devices, cushioning, etc. / Упаковочные материалы и приспособления. Включая обертки, бумагу, пленки, фольгу, веревки, устройства для запечатывания, прокладки и т.д.
Сборник (ASTM):
15.10 Packaging; Primary Barrier Packaging; Cannabis / Упаковка; Первичная барьерная упаковка; Каннабис
Тематика:
Paper & Packaging
Описание
Значение и использование

In the distribution system for many products there is a phase wherein the packaged product may be stored for a period of time in a manner such that one or more containers are superimposed one upon the other. The bottom package is thus continually stressed with a constant load.

This test method subjects a container, empty or filled, to a predetermined static load, and to specified atmospheric conditions, if required.

Область применения

1.1 This test method is designed to determine the resistance of a shipping container to a vertically applied constant load for either a specified time or to failure. The test method may also be used for palletized or unitized load configurations.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of whoever uses this standard to consult and establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. For specific precautionary statements, see Section 6.

Ключевые слова:
compression test; creep test; duration of load; packaging; shipping container; shipping unit; stacking life; storage environment; Distribution systems; Compression testing--container materials; Duration of load; Loading tests--shipping materials; Packing/packaging materials/systems; Pallets; Shipping; Shipping containers/materials/applications; Stacking test; Storage; Time-to-failure (TTF); Weibull parameters