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ASTM E995-97
Standard Guide for Background Subtraction Techniques in Auger Electron and X-ray Photoelectron Spectroscopy
4 стр.
Заменен
Печатное изданиеЭлектронный (pdf)
81.12 $ (включая НДС 20%)
Разработчик:
Зарубежные/ASTM
ICS:
17.180.30 Optical. Including spectroscopes, geodetic instruments, etc. / Оптические измерительные приборы. Включая спектроскопы, геодезические инструменты и т.д.
Сборник (ASTM):
03.06 Molecular Spectroscopy and Separation Science; Surface Analysis / Молекулярная спектроскопия; Анализ поверхности
Тематика:
Spectroscopy
Описание
Область применения

1.1 The purpose of this guide is to familiarize the analyst with the principal background subtraction techniques presently in use together with the nature of their application to data acquisition and manipulation.

1.2 This guide is intended to apply to background subtraction in electron, X-ray, and ion-excited Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS).

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Ключевые слова:
Auger electron spectroscopy; surface analysis; X-ray photoelectron spectroscopy; background subtraction